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Journal Article

[Statistical Methods in Reliability]: Discussion

Ray E. Schafer
Technometrics
Vol. 25, No. 4 (Nov., 1983), pp. 329-330
DOI: 10.2307/1267850
Stable URL: http://www.jstor.org/stable/1267850
Page Count: 2

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Topics: Applied statistics, Statistical models, Statistics
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