Access

You are not currently logged in.

Access your personal account or get JSTOR access through your library or other institution:

login

Log in to your personal account or through your institution.

Allelic Mapping in Yeast by X-ray-Induced Mitotic Reversion

T. R. Manney and R. K. Mortimer
Science
New Series, Vol. 143, No. 3606 (Feb. 7, 1964), pp. 581-583
Stable URL: http://www.jstor.org/stable/1713634
Page Count: 3
  • More info
  • Cite this Item
Allelic Mapping in Yeast by X-ray-Induced Mitotic Reversion
Preview not available

Abstract

A new method for determining the sequence of mutational sites is based on the linear dose-effect relation for x-ray induction of allelic recombination in Saccharomyces cerevisiae. Mutations at two loci have been mapped by this method. The use of x-ray simplifies allelic mapping and greatly increases its sensitivity.

Page Thumbnails

  • Thumbnail: Page 
581
    581
  • Thumbnail: Page 
582
    582
  • Thumbnail: Page 
583
    583