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Allelic Mapping in Yeast by X-ray-Induced Mitotic Reversion
T. R. Manney and R. K. Mortimer
New Series, Vol. 143, No. 3606 (Feb. 7, 1964), pp. 581-583
Published by: American Association for the Advancement of Science
Stable URL: http://www.jstor.org/stable/1713634
Page Count: 3
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A new method for determining the sequence of mutational sites is based on the linear dose-effect relation for x-ray induction of allelic recombination in Saccharomyces cerevisiae. Mutations at two loci have been mapped by this method. The use of x-ray simplifies allelic mapping and greatly increases its sensitivity.
Science © 1964 American Association for the Advancement of Science