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Journal Article

Field Ion Microscopy

Erwin W. Müller
Science
New Series, Vol. 149, No. 3684 (Aug. 6, 1965), pp. 591-601
Stable URL: http://www.jstor.org/stable/1716643
Page Count: 11

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Topics: Atoms, Electric fields, Ions, Evaporation, Helium, Crystals, Tungsten, Microscopy, Microscopes, Platinum
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Field Ion Microscopy
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