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On Finding a Single Defective in Binomial Group Testing

F. K. Hwang
Journal of the American Statistical Association
Vol. 69, No. 345 (Mar., 1974), pp. 146-150
DOI: 10.2307/2285513
Stable URL: http://www.jstor.org/stable/2285513
Page Count: 5
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On Finding a Single Defective in Binomial Group Testing
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Abstract

Kumar and Sobel studied the problem of finding a single defective in an infinite binomial population by group testing. Let E(T) denote the minimum expected number of group tests needed to find one defective unit if the units come from an infinite population. If a group of m units from this population is tested and found defective, then let F(m) denote the minimum expected number of tests to find one defective unit in this group. This article proves two conjectures made by Kumar and Sobel concerning E(T) and F(m) and gives a closed-form solution for F(m).

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