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The Analysis of Residuals in Cross-Classified Tables
Shelby J. Haberman
Vol. 29, No. 1 (Mar., 1973), pp. 205-220
Published by: International Biometric Society
Stable URL: http://www.jstor.org/stable/2529686
Page Count: 16
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Techniques are proposed for analysis of residuals associated with log-linear models for frequency tables. Results are applied to two-way tables and logit models.
Biometrics © 1973 International Biometric Society