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Incomplete Block Designs for Parallel-Line Assays
Kyi Win and A. Dey
Vol. 36, No. 3 (Sep., 1980), pp. 487-492
Published by: International Biometric Society
Stable URL: http://www.jstor.org/stable/2530216
Page Count: 6
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New incomplete block designs for parallel-line assays are proposed. These designs permit the estimation of three important contrasts, namely 'preparation', 'combined slope' and 'parallelism', free from block effects.
Biometrics © 1980 International Biometric Society