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A Goodness-of-Fit Test for Binary Regression Models, Based on Smoothing Methods
S. le Cessie and J. C. van Houwelingen
Vol. 47, No. 4 (Dec., 1991), pp. 1267-1282
Published by: International Biometric Society
Stable URL: http://www.jstor.org/stable/2532385
Page Count: 16
You can always find the topics here!Topics: Statistical variance, Statistical models, Statistics, Null hypothesis, Simulations, Statistical estimation, Logistics, Regression analysis, Probabilities, Kernel functions
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A new global test statistic for models with continuous covariates and binary response is introduced. The test statistic is based on nonparametric kernel methods. Explicit expressions are given for the mean and variance of the test statistic. Asymptotic properties are considered and approximate corrections due to parameter estimation are presented. Properties of the test statistic are studied by simulation. The goodness-of-fit method is illustrated on data from a Dutch follow-up study on preterm infants. Recommendations for practitioners are given.
Biometrics © 1991 International Biometric Society