Access

You are not currently logged in.

Access your personal account or get JSTOR access through your library or other institution:

login

Log in to your personal account or through your institution.

If You Use a Screen Reader

This content is available through Read Online (Free) program, which relies on page scans. Since scans are not currently available to screen readers, please contact JSTOR User Support for access. We'll provide a PDF copy for your screen reader.

Development of a Lifting Wavelet Representation for Surface Characterization

X. Q. Jiang, L. Blunt and K. J. Stout
Proceedings: Mathematical, Physical and Engineering Sciences
Vol. 456, No. 2001 (Sep. 8, 2000), pp. 2283-2313
Published by: Royal Society
Stable URL: http://www.jstor.org/stable/2665504
Page Count: 31
  • Read Online (Free)
  • Cite this Item
Since scans are not currently available to screen readers, please contact JSTOR User Support for access. We'll provide a PDF copy for your screen reader.
Development of a Lifting Wavelet Representation for Surface Characterization
Preview not available

Abstract

This paper reviews the existing numerical analysis methods and their problems in surface metrology. Based on the requirements of functional analysis of surfaces, this paper proposes a lifting wavelet representation for extraction of different components of a surface. The theory of the lifting wavelet is introduced and a fast algorithm is developed. Different frequency components of the surface can be separated, extracted and then reconstructed according the intended requirements of functional analysis. The surface textures can be highlighted and multi-scalar topographical features can be identified and clearly recovered. In order to verify the behaviour of the new model, a computer simulation based on sinusoidal and triangular waveforms is used. Case studies are conducted using a series of typical surfaces of engineering and bioengineering, such as planes, cylinders and curves, measured by contact (stylus) and non-contact (phase-shifting interferometry) instruments, to demonstrate the feasibility and applicability of using the lifting wavelet model in the analysis of these surfaces.

Page Thumbnails

  • Thumbnail: Page 
2283
    2283
  • Thumbnail: Page 
2284
    2284
  • Thumbnail: Page 
2285
    2285
  • Thumbnail: Page 
2286
    2286
  • Thumbnail: Page 
2287
    2287
  • Thumbnail: Page 
2288
    2288
  • Thumbnail: Page 
2289
    2289
  • Thumbnail: Page 
2290
    2290
  • Thumbnail: Page 
2291
    2291
  • Thumbnail: Page 
2292
    2292
  • Thumbnail: Page 
2293
    2293
  • Thumbnail: Page 
2294
    2294
  • Thumbnail: Page 
2295
    2295
  • Thumbnail: Page 
2296
    2296
  • Thumbnail: Page 
2297
    2297
  • Thumbnail: Page 
2298
    2298
  • Thumbnail: Page 
2299
    2299
  • Thumbnail: Page 
2300
    2300
  • Thumbnail: Page 
2301
    2301
  • Thumbnail: Page 
2302
    2302
  • Thumbnail: Page 
2303
    2303
  • Thumbnail: Page 
2304
    2304
  • Thumbnail: Page 
2305
    2305
  • Thumbnail: Page 
2306
    2306
  • Thumbnail: Page 
2307
    2307
  • Thumbnail: Page 
2308
    2308
  • Thumbnail: Page 
2309
    2309
  • Thumbnail: Page 
2310
    2310
  • Thumbnail: Page 
2311
    2311
  • Thumbnail: Page 
2312
    2312
  • Thumbnail: Page 
2313
    2313