Access

You are not currently logged in.

Access your personal account or get JSTOR access through your library or other institution:

login

Log in to your personal account or through your institution.

If You Use a Screen Reader

This content is available through Read Online (Free) program, which relies on page scans. Since scans are not currently available to screen readers, please contact JSTOR User Support for access. We'll provide a PDF copy for your screen reader.

Imaging in-plane and normal stresses near an interface crack using traction force microscopy

Ye Xu, Wilfried C. Engl, Elizabeth R. Jerison, Kevin J. Wallenstein, Callen Hyland, Larry A. Wilen, Eric R. Dufresne and Katepalli R. Sreenivasan
Proceedings of the National Academy of Sciences of the United States of America
Vol. 107, No. 34 (August 24, 2010), pp. 14964-14967
Stable URL: http://www.jstor.org/stable/27862176
Page Count: 4
  • Read Online (Free)
  • Subscribe ($19.50)
  • Cite this Item
Since scans are not currently available to screen readers, please contact JSTOR User Support for access. We'll provide a PDF copy for your screen reader.
Imaging in-plane and normal stresses near an interface crack using traction force microscopy
Preview not available

Abstract

Colloidal coatings, such as paint, are all around us. However, we know little about the mechanics of the film-forming process because the composition and properties of drying coatings vary dramatically in space and time. To surmount this challenge, we extend traction force microscopy to quantify the spatial distribution of all three components of the stress at the interface of two materials. We apply this approach to image stress near the tip of a propagating interface crack in a drying colloidal coating and extract the stress intensity factor.

Page Thumbnails

  • Thumbnail: Page 
[14964]
    [14964]
  • Thumbnail: Page 
14965
    14965
  • Thumbnail: Page 
14966
    14966
  • Thumbnail: Page 
14967
    14967