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Genetic Control of Radiation Sensitivity in Yeast

P. P. Puglisi
Radiation Research
Vol. 31, No. 4 (Aug., 1967), pp. 856-866
DOI: 10.2307/3572351
Stable URL: http://www.jstor.org/stable/3572351
Page Count: 11
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Genetic Control of Radiation Sensitivity in Yeast
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Abstract

A strain of Saccharomyces cerevisiae (FF53/b) showing an abnormal survival curve to X-radiation is described. It is derived from a normal haploid parent and is killed exponentially by X-rays without showing the tail due to the phenotypically resistant fraction of cells normally found in any yeast culture. The genetic analysis has shown that strain FF53/b is an autodiploid that has lost the initial "shoulder" of radioresistence typical of diploid strains. This abnormal behavior is due to a single dominant genetic factor which is probably lethal in haploid conditions.

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