You are not currently logged in.
Access your personal account or get JSTOR access through your library or other institution:
If You Use a Screen ReaderThis content is available through Read Online (Free) program, which relies on page scans. Since scans are not currently available to screen readers, please contact JSTOR User Support for access. We'll provide a PDF copy for your screen reader.
Electron Energy-Loss Spectroscopy for Elemental Analysis [and Discussion]
R. F. Egerton and A. F. Fell
Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences
Vol. 305, No. 1491, Recent Advances in Analytical Chemistry (Jul. 5, 1982), pp. 521-533
Published by: Royal Society
Stable URL: http://www.jstor.org/stable/37114
Page Count: 13
Since scans are not currently available to screen readers, please contact JSTOR User Support for access. We'll provide a PDF copy for your screen reader.
Preview not available
Electron-beam microanalysis is most commonly carried out by recording the spectrum of X-rays emitted from a sample. However, an alternative method is to analyse the energy spectrum of electrons transmitted through a thin specimen. For the detection and measurement of elements of low atomic number, this energy-loss method is capable of high sensitivity; detection of less than 10-20 g has been reported, while the attainable spatial resolution is probably below 1 nm. After outlining the basic physics involved, the paper gives examples of energy-loss analysis of thin films, intercalation compounds, ceramics and biological samples, and its application to the measurement of radiation damage in organic materials.
Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences © 1982 Royal Society