Journal Article
Robust Empirical Bayes Analyses of Event Rates
Donald P. Gaver and I. G. O'Muircheartaigh
Technometrics
Vol. 29, No. 1 (Feb., 1987), pp. 1-15 (15 pages)
Published By: Taylor & Francis, Ltd.
DOI: 10.2307/1269878
https://www.jstor.org/stable/1269878
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