This article shows that the likelihood ratio test for the equality of location parameters of k (k ≥ 2) two-parameter exponential distributions with unequal scale parameters, in general, depends on the unknown scale parameters under the null hypothesis. A modification of the likelihood ratio test is suggested, which is applicable to Type II censored or complete data. The suggested test is consistent and asymptotically optimal in the sense of Bahadur efficiency. For k = 2, the power function of the test is obtained, and the test is shown to be unbiased. A set of data is analyzed.
The mission of Technometrics is to contribute to the development and use of statistical methods in the physical, chemical, and engineering sciences. Its content features papers that describe new statistical techniques, illustrate innovative application of known statistical methods, or review methods, issues, or philosophy in a particular area of statistics or science, when such papers are consistent with the journal's mission. Application of proposed methodology is justified, usually by means of an actual problem in the physical, chemical, or engineering sciences. Papers in the journal reflect modern practice. This includes an emphasis on new statistical approaches to screening, modeling, pattern characterization, and change detection that take advantage of massive computing capabilities. Papers also reflect shifts in attitudes about data analysis (e.g., less formal hypothesis testing, more fitted models via graphical analysis), and in how important application areas are managed (e.g., quality assurance through robust design rather than detailed inspection).
Building on two centuries' experience, Taylor & Francis has grown rapidlyover the last two decades to become a leading international academic publisher.The Group publishes over 800 journals and over 1,800 new books each year, coveringa wide variety of subject areas and incorporating the journal imprints of Routledge,Carfax, Spon Press, Psychology Press, Martin Dunitz, and Taylor & Francis.Taylor & Francis is fully committed to the publication and dissemination of scholarly information of the highest quality, and today this remains the primary goal.
This item is part of JSTOR collection
For terms and use, please refer to our Terms and Conditions
Technometrics
© 1986 American Statistical Association
Request Permissions