Journal Article
An Exact Test for Comparing Location Parameters of k Exponential Distributions with Unequal Scales Based on Type II Censored Data
H. K. Hsieh
Technometrics
Vol. 28, No. 2 (May, 1986), pp. 157-164 (8 pages)
Published By: Taylor & Francis, Ltd.
DOI: 10.2307/1270452
https://www.jstor.org/stable/1270452
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